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Characterizing charged muonium in GaAs and Si

dc.contributor.authorSchultz, Bradley Edmund
dc.date.accessioned2025-05-29T00:24:26Z
dc.date.available2025-05-29T00:24:26Z
dc.date.issued2005
dc.identifier.doihttps://doi.org/10.7939/r3-q7kz-0k34
dc.language.isoen
dc.rightsThis thesis is made available by the University of Alberta Libraries with permission of the copyright owner solely for the purpose of private, scholarly or scientific research. This thesis, or any portion thereof, may not otherwise be copied or reproduced without the written consent of the copyright owner, except to the extent permitted by Canadian copyright law.
dc.subjectGallium arsenide.
dc.subjectSilicon.
dc.subjectGallium arsenide semiconductors.
dc.titleCharacterizing charged muonium in GaAs and Si
dc.typehttp://purl.org/coar/resource_type/c_46ec
thesis.degree.grantorhttp://id.loc.gov/authorities/names/n79058482
thesis.degree.levelMaster's
thesis.degree.nameMaster of Science
ual.date.graduation2005
ual.departmentDepartment of Physics
ual.jupiterAccesshttp://terms.library.ualberta.ca/public

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