Adaptation of intermittent contact modes to inverted atomic force microscopy

dc.contributor.authorChan, Sandra Suk Fung
dc.date.accessioned2025-05-29T08:39:10Z
dc.date.available2025-05-29T08:39:10Z
dc.date.issued2005
dc.identifier.doihttps://doi.org/10.7939/r3-qqr3-yy87
dc.language.isoen
dc.rightsThis thesis is made available by the University of Alberta Libraries with permission of the copyright owner solely for the purpose of private, scholarly or scientific research. This thesis, or any portion thereof, may not otherwise be copied or reproduced without the written consent of the copyright owner, except to the extent permitted by Canadian copyright law.
dc.subjectSurfaces (Technology). Testing.
dc.subjectSurface chemistry.
dc.subjectAtomic force microscopy.
dc.titleAdaptation of intermittent contact modes to inverted atomic force microscopy
dc.typehttp://purl.org/coar/resource_type/c_46ec
thesis.degree.grantorhttp://id.loc.gov/authorities/names/n79058482
thesis.degree.levelMaster's
thesis.degree.nameMaster of Science
ual.date.graduation2005
ual.departmentDepartment of Chemistry
ual.jupiterAccesshttp://terms.library.ualberta.ca/public

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